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Volumn 102, Issue 4, 2007, Pages

Growth modes of nanocrystalline Ni/Pt multilayers with deposition temperature

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; MORPHOLOGY; NANOCRYSTALLINE MATERIALS; NICKEL COMPOUNDS; PLATINUM COMPOUNDS; POLYIMIDES; TEMPERATURE MEASUREMENT; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 34548415499     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2769785     Document Type: Article
Times cited : (14)

References (31)
  • 11
    • 84892388102 scopus 로고
    • 0001-8732 10.1080/00018738900101112
    • B. Y. Jin and J. B. Ketterson, Adv. Phys. 0001-8732 10.1080/ 00018738900101112 38, 189 (1989), and references therein.
    • (1989) Adv. Phys. , vol.38 , pp. 189
    • Jin, B.Y.1    Ketterson, J.B.2
  • 20
    • 5844271216 scopus 로고
    • 0031-9007 10.1103/PhysRevLett.73.1517
    • M. Siegert and M. Pliscke, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.73.1517 73, 1517 (1994).
    • (1994) Phys. Rev. Lett. , vol.73 , pp. 1517
    • Siegert, M.1    Pliscke, M.2
  • 21
    • 0001591237 scopus 로고    scopus 로고
    • 0031-9007 10.1103/PhysRevLett.78.2791
    • J. -K. Zuo and J. F. Wendelken, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.78.2791 78, 2791 (1997).
    • (1997) Phys. Rev. Lett. , vol.78 , pp. 2791
    • Zuo, J.-K.1    Wendelken, J.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.