Measurement of critical exponents of nanostructured gold thin films

Surface Review and Letters

Volumn 10, Issue 6, 2003, Pages 903-908

  Melo, L L ^a   Salvadori, M C ^a   Cattani, M ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Critical exponents; Gold thin films

Indexed keywords

DEPOSITION; GRAIN SIZE AND SHAPE; IONS; NANOSTRUCTURED MATERIALS; PLASMAS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE ROUGHNESS; THIN FILMS;

CRITICAL EXPONENTS; GROWTH DYNAMICS;

GOLD;

GOLD; SILICON;

ARTICLE; CHEMICAL STRUCTURE; FILM; FUNCTIONAL ASSESSMENT; GRAIN; GROWTH REGULATION; ION TRANSPORT; MEASUREMENT; METAL BINDING; NANOPARTICLE; SCANNING TUNNELING MICROSCOPY; THICKNESS;

EID: 1542515225     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X03005694     Document Type: Article

References (30)

1. P. Moriarty, Rep. Prog. Phys. 64, 297 (2001).
2. N. Cowlam, Solid State Phenom. 56, 145 (1997).
3. H. Gleiter, Acta Mater. 48, 1 (2000).
4. M. C. Salvadori, L. L. Melo, M. Cattani, O. R. Monteiro and I. C. Brown, "Measurement of critical exponents of platinum thin films," accepted for publication in Surf. Rev. Lett. (2003).
5. Handbook of Plasma Immergion Ion Implantation and Deposition, ed. A. Anders (John Wiley & Sons).
6. I. G. Brown, Annual Review of Materials Science, Vol. 28 (Annual Reviews, Inc., Palo Alto, CA, 1998).
7. O. R. Monteiro, Nucl. Instrum. Methods Phys. Res. B148, 12 (1999).
8. I. G. Brown, A. Anders, M. R. Dickinson, R. A. MacGill and O. R. Monteiro, Surf. Coat. Technol. 112, 271 (1999).
9. G. M. Pharr, D. L. Callahan, S. D. McAdams, T. Y. Tsui, S. Anders, A. Anders, J. W. Ager I. G. Brown, C. S. Bhatia, S. R. P. Silva and J. Robertson, Appl. Phys. Lett. 68, 779 (1996).
10. R.A. MacGill, M.R. Dickinson, A. Anders, O.R. Monteiro and I.G. Brown, Rev. Sci. Instrum. 69, 801 (1998).
11. A. L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, 1995).
12. A. Anders and G. Yu. Yushkov, J. Appl. Phys. (2002), accepted for publication.
13. P. Herrasti, P. Ocón, L. Vásquez, R. C. Salvarezza, J. M. Vara and A. J. Arvia, Phys. Rev. A45, 7440 (1992).
14. R. C. Salvarezza, L. Vásquez, P. Herrasti, P. Ocón, J. M. Vara and A. J. Arvia, Europhys. Lett. 20, 727 (1992).
15. M. C. Salvadori, M. G. Silveira and M. Cattani, Phys. Rev. E58, 6814 (1998).
16. M. C. Salvadori, M. G. Silveira and M. Cattani, Thin Solid Films 376, 264 (2000).
17. M. C. Salvadori, A. M. Pizzo and M. Cattani, Surf. Rev. Lett. 8, 291 (2001).
18. M. Cattani, and M. C. Salvadori, Surf. Rev. Lett. 8, 347 (2001).
19. M. C. Salvadori, L. L. Melo, D. R. Martins, A. R. Vaz and M. Cattani, Surf. Rev. Lett. 9, 1409 (2002).
20. F. Family and T. Vicsek, J. Phys. A18, L75 (1985).
21. J. Krim, I. Heyvaert, C. Van Haesendock and Y. Bruynseraede, Phys. Rev. Lett. 70, 57 (1993).
22. J.M. Gómez Rodriguez, A.M. Baró and R. C. Salvarezza, J. Vac. Sci. Technol. B9, 495 (1991).
23. P. Meakin, Phys. Rep. 235, 189 (1993).
24. D. D. Vedensky, A. Zangwill and C. N. Luse, Phys. Rev. E48, 852 (1993).
25. I. T. Koponen, Nucl. Instrum. Methods Phys. Res. B171, 314 (2000).
26. W. M. Tong, E. J. Snyder, R. S. Williams, A. Yanase, Y. Segawa and M. S. Anderson, Surf. Sci. Lett. 277, L63 (1994).
27. W. M. Tong and R. S. Williams, Ann. Rev. Phys. Chem. 45, 401 (1994).
28. C. Castellano, M. Marsili and L. Pietronero, Phys. Rev. Lett. 16, 3257 (1998).
29. E. Medina, T. Hwa and M. Kardar, Phys. Rev. A39, 3053 (1989).
30. J. F. Ziegler and J. P. Biersack, see for example the website www.SRIM.org