X-ray magnetic circular dichroic magnetometry on Ni/Pt multilayers

Journal of Applied Physics

Volumn 89, Issue 7, 2001, Pages 3874-3879

  Poulopoulos, P ^a   Wilhelm, F ^a   Wende, H ^a   Ceballos, G ^a   Baberschke, K ^a   Benea, D ^b   Ebert, H ^b   Angelakeris, M ^c   Flevaris, N K ^c   Rogalev, A ^d   Brookes, N B ^d  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035309755     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1345862     Document Type: Article

References (41)

1. S. Hashimoto and Y. Ochiai, J. Magn. Magn. Mater. 88, 211 (1990).
2. R. Krishnan, H. Lassri, M. Porte, M. Tessier, and P. Renaudin, Appl. Phys. Lett. 59, 3649 (1991).
3. R. Krishnan, H. Lassri, S. Prasad, M. Porte, and M. Tessier, J. Appl. Phys. 73, 6433 (1993).
4. P. Poulopouloss, M. Angelakeris, D. Niarchos, and N. K. Flevaris, J. Magn. Magn. Mater. 140-144, 613 (1995).
5. M. Angelakeris, P. Poulopoulos, N. Vouroutzis, M. Nyvlt, V. Prosser, S. Visnovsky, R. Krishnan, and N. K. Flevaris, J. Appl. Phys. 82, 5640 (1997).
6. S.-C. Shin, G. Srinivas, Y.-S. Kim, and M.-G.- Kim, Appl. Phys. Lett. 73, 393 (1998).
7. Y.-S. Kim and S.-C. Shin, Phys. Rev. B 59, R6597 (1999).
8. F. Wilhelm, P. Poulopoulos, P. Ssrivastava, H. Wende, M. Farle, K. Baberschke, M. Angelakeris, N. K. Flevaris, W. Grange, J.-P. Kappler, G. Ghiringhelli, and N. B. Brookes, Phys. Rev. B 61, 8647 (2000).
9. G. Srinivas and S.-C. Shin, J. Magn. Magn. Mater. 198-199, 341 (1999).
10. G. Schütz, W. Wagner, W. Wilhelm, P. Kiemle, R. Zeller, R. Frahm, and G. Materlik, Phys. Rev. Lett. 58, 737 (1987).
11. Spin-Orbit-Influenced Spectroscopies of Magnetic Solids, edited by H. Ebert and G. Schütz, Lect. Notes Phys. Vol. 466 (Springer, New York, 1996), and references therein.
12. R. E. Parra and J. W. Cable, J. Appl. Phys. 50, 7522 (1979).
13. R. E. Parra and J. W. Cable, Phys. Rev. B 21, 5494 (1980).
14. R. E. Parra and R. Medina, Phys. Rev. B 22, 5460 (1980).
15. The individual Pt and Ni thicknesses were determined by precalibrated quartz crystals and XRD with a precision of about 5% and then were approximated to the closest integer or half-integer numbers of atomic planes (monolayers) n and m. This representation gives a better physical insight.
16. W. Staiger, A. Michel, V. Piedrron-Bohnes, N. Hermann, and M. C. Cadeville, J. Mater. Res. 12, 161 (1997).
17. F. Wilhelm, P. Poulopoulos, G. Ceballos, H. Wende, K. Baberschke, P. Srivastava, D. Benea, H. Ebert, M. Angelakeris, N. K. Flevaris, D. Niarchos, A. Rogalev, and N. B. Brookes, Phys. Rev. Lett. 85, 413 (2000).
18. N. Drescher, G. Snell, U. Kleineberg, H.-J. Stock, N. Müller, U. Heinzmann, and N. B. Brookes, Rev. Sci. Instrum. 68, 1939 (1997).
19. J. Goulon, N. B. Brookes, C. Gauthier, J. B. Goedkoop, C. Goulon-Ginet, M. Hagelstein, and A. Rogalev, Physica B 208&209, 199 (1995).
20. B. T. Thole, P. Carra, F. Sette, and G. van der Laan, Phys. Rev. Lett. 68, 1943 (1992).
21. P. Carra, B. T. Thole, M. Altarelli, and X.-D. Wang, Phys. Rev. Lett. 70, 694 (1993).
22. O. K. Andersen, O. Jepsen, and M. Sob, in Lect. Notes. Phys. No. 283, Electronic Band Structure and Its Applications, edited by M. Yussouff (Springer-Verlag, Berlin, 1987), p. 1.
23. U. von Barth and L. Hedin, J. Phys. C 5, 1629 (1972).
24. P. Srivastava, N. Haack, H. Wende, R. Chauvistré, and K. Baberschke, Phys. Rev. B 56, R4398 (1997), and references therein.
25. P. Srivastava, F. Wilhelm, A. Ney, M. Farle, H. Wende, N. Haack, G. Ceballos, and K. Baberschke, Phys. Rev. B 58, 5701 (1998).
26. J. Stöhr and R. Nakajima, IBM J. Res. Dev. 42, 73 (1998).
27. W. Grange, M. Maret, J.-P. Kappler, J. Vogel, A. Fontaine, F. Petroff, G. Krill, A. Rogalev, J. Goulon, M. Finazzi, and N. B. Brookes, Phys. Rev. B 58, 6298 (1998), and references therein.
28. P. Poulopoulos, Ph.D. thesis, Aristotle University of Thessaloniki, 1996.
29. C. Kittel, Introduction to Solid State Physics (Wiley, New York, 1976), p. 465.
30. J. W. Coyle, J. G. Booth, J. A. Cowen, A. D. Boardman, K. M. Booth, and R. Krishnan, J. Magn. Magn. Mater. 156, 33 (1996).
31. G. Schütz, S. Stähler, M. Knülle, P. Fischer, S. Parkin, and H. Ebert, J. Appl. Phys. 73, 6430 (1993)..
32. W. J. Antel, Jr., M. M. Schwickert, T. Lin, W. L. O'Brien, and G. R. Harp, Phys. Rev. B 60, 12933 (1999).
33. W. Platow, U. Bovensiepen, P. Poulopoulos, M. Farle, K. Baberschke, L. Hammer, S. Walter, S. Müller, and K. Heinz, Phys. Rev. B 59, 12641 (1999).
34. N. Nakajima, T. Koide, T. Shidara, H. Miyauchi, H. Fukutani, A. Fujimori, K. Iio, T. Katayama, M. Nývlt, and Y. Suzuki, Phys. Rev. Lett. 81, 5229 (1998).
35. I. V. Solovyev, P. H. Dederichs, and I. Mertig, Phys. Rev. B 52, 13419 (1995).
36. Y.-S. Kim, J.-R. Jeong, M.-G. Kim, and S.-C. Shin, IEEE Trans. Magn. 35, 3073 (1999).
37. Indeed, the size of the grains is 30-250 nm (Ref. 5), so their volume contribution is less than 5%.
38. J. Tersoff, Phys. Rev. Lett. 74, 434 (1995).
39. 2 sample.
40. X. W. Jhou and H. N. G. Wadley, J. Appl. Phys. 84, 2301 (1998).
41. The results of Ref. 6 for the number of "dead" layers may have been overestimated because the analysis of the magnetizations was done at room temperature which is close to the Curie temperature for samples with very thin Ni layers (Ref. 9). However, interestingly, samples with thin Pt and very thick (up to 3 nm) Ni layers still show considerably reduced magnetizations (Ref. 7). In a recent work, the same authors consider the effects of structural defects due to the deposition process, on the magnetizations of even bulk-like Ni films. Such a source of reduction of their magnetizations cannot be excluded [see J.-R. Jeong and S.-C. Shin, Appl. Phys. Lett. 75, 3174 (1999)].