The interpretation of indexing of high Σ CSL grain boundaries from ceramics

Journal of Microscopy

Volumn 227, Issue 3, 2007, Pages 309-314

  Shih, Shao Ju ^a   Park, Myung Beom ^a   Cockayne, David J H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Brandon criterion; CSL; EBSD; Palumbo and Aust criterion

Indexed keywords

AUTOMATION; CERAMIC MATERIALS; GRAIN BOUNDARIES; STRONTIUM TITANATES; TITANIUM COMPOUNDS;

BRANDON CRITERIA; CSL; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; GRAIN-BOUNDARIES; GRAIN-BOUNDARY MISORIENTATIONS; INDIVIDUAL GRAINS; ITS APPLICATIONS; KIKUCHI PATTERNS; PALUMBO AND AUST CRITERIA;

POLYCRYSTALLINE MATERIALS;

AUTOMATION; CERAMICS; CONFERENCE PAPER; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; INFRARED SPECTROSCOPY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 34548295633     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01815.x     Document Type: Conference Paper

References (20)

1. Baba-Kishi, K.Z. (2002) Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis. J. Mater. Sci. 37, 1715 1746.
2. Bache, M.R., Evans, W.J. & Davies, H.M. (1997) Electron back scattered diffraction (EBSD) analysis of quasi-cleavage and hydrogen induced fractures under cyclic and dwell loading in titanium alloys. J. Mater. Sci. 32, 3435 3442.
3. Bollmann, W. (1970) Crystal defects and crystalline interfaces, pp. 118 142. Springer-Verlag, Berlin.
4. Brandon, D.G. (1966) The structure of high angle grain boundaries. Acta Metall. 14, 1479 1484.
5. Farrer, J.K., Michael, J.R. & Carter, C.B. (2000) Electron Backscatter Diffraction in Materials Science (ed. by A.J. Schwartz, M. Kumar and B.L. Adams pp. 299 318. Kluwer Academic /Plenum, New York.
6. Gourgues, A.F. (2002) Electron backscatter diffraction and cracking. Mater. Sci. Technol. 18, 119 133.
7. Humphreys, F.J. (2001) Grain and subgrain characterisation by electron backscatter diffraction. J. Mater. Sci. 36, 3833 3854.
8. Kim, D.-I., Oh, K.H., Lee, H.-C., Chang, Y.J., Sohn, W.S. & Jang, J. (2004) Characterization of crystallographic properties of SMC poly Si using electron backscattered diffraction. J. Microsc. 215, 121 126.
9. Koblischka-Veneva, A. & Mucklich, F. (2002) Orientation imaging microscopy applied to BaTiO3 ceramics. Cryst. Eng. 5, 235 242.
10. Palumbo, G. & Aust, K.T. (1990) Structure-dependence of intergranular corrosion in high purity nickel. Acta Metall. Mater. 38, 2343 2352.
11. Palumbo, G. & Aust, K.T. (1992) Materials Interfaces-Atomic-Level Structure and Properties (ed. by D. Wolf and S. Yip pp. 190 211. Chapman & Hall, London
12. Palumbo, G., Aust, K.T., Lehockey, E.M., Erb, U. & Lin, P. (1998) On a more restrictive geometric criterion for "special" CSL grain boundaries. Scr. Mater. 38, 1685 1690.
13. Pan, A., Adams, B.L., Olson, T. & Panayotou, N. (1996) Grain-boundary structure effects on intergranular stress corrosion cracking of alloy X-750. Acta Meter. 44, 4685 4695.
14. Pennock, G.M., Barnhoorn, A., Bons, A.J. & Drury, M.R. (2001) EBSD of zeolites. J. Mater. Sci. Lett. 20, 1099 1101.
15. Prior, D.J. & Wheeler, J. (1999) Feldspar fabrics in a greenschist facies albite-rich mylonite from electron backscatter diffraction. Tectonophysics 303, 29 49.
16. Randle, V. (1993) The Measurement of Grain Boundary Geometry (ed. by B. Cantor and M.J. Goringe pp. 46 48. Institute of Physics Publishing, Bristol and Philadelphia.
17. Randle, V. & Engler, O. (2000) Introduction to Texture Analysis Macrotexture, Microtexture and Orientation Mapping, pp. 162 165. Gordon and Breach Science Publishers, Amsterdam.
18. Vaudin, M.D. (2005) Pseudosymmetry in EBSD patterns, Microsc. Microanal. 11, S02, 510 511.
19. Wright, S.I. (2000) Electron Backscatter Diffraction in Materials Science (ed. by A.J. Schwartz, M. Kumar and B.L. Adams pp. 51 64. Kluwer Academic /Plenum, New York.
20. Zhou, Y., Aust, K.T., Erb, U. & Palumbo, G. (2001) Effects of grain boundary structure on carbide precipitation in 304L stainless steel. Scr. Mater. 45, 49 54.