Orientation imaging microscopy applied to BaTiO3 ceramics

Crystal Engineering

Volumn 5, Issue 3-4 SPEC., 2002, Pages 235-242

  Koblischka Veneva, A ^a   Mucklich F ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

BaTiO3 ceramics; Grain orientation; OIM analysis

Indexed keywords

BARIUM TITANATE; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; IMAGE QUALITY;

GRAIN ORIENTATION;

CERAMIC MATERIALS;

EID: 0037288042     PISSN: 14630184     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1463-0184(02)00034-5     Document Type: Article

References (13)

1. Dingley D.J., Randle V. J. Mater. Sci. 27:1992;4585.
2. Schwarzer R.A. Mat Sci. Forum. 287-288:1998;23.
3. Farrer J.K., Michael J.R., Carter C.B. Schwartz A.J., Kumar M., Adams B.L. Electron Backscatter Diffraction in Materials Science. 2000;299 Kluwer Academic/Plenum Publishers, New York.
4. Mulvihill M.L., Gülgün M.A., Bischoff E., Rühle M. Z. Metallkunde. 89:1998;546.
5. Ernst F., Mulvihill M.L., Kienzle O., Rühle M. J. Am. Ceram. Soc. 84:2001;1885.
6. Cho J., Wang C.-M., Chan H.M., Rickman J.M., Harmer M.P. J. Mat. Sci. 37:2002;59.
7. Y. Yasutomi, Y. Sakaida, K. Hiramatsu, Y. Ikuhara, T. Yamamoto, Proc. Ninth CIMTEC World Ceramics Congress, Part A, P. Vincenzini, (Ed.).s Techna Srl (1999), p. 233.
8. Veith M., Mathur S., Lecerf N., Huch V., Decker T., Beck H.P., Eiser W., Haberkorn R. J. Sol-Gel Sci. Technol. 15:2000;145.
9. Muñoz-Saldaña J., Schneider G.A., Eng L.M. Surf. Sci. 480:2001;L402.
10. Orientation Imaging Microscopy software version V3.0, user manual, TSL, Draper, UT.
11. Baba-Kishi K.Z. J. Mat. Sci. 37:2002;1715.
12. Koblischka-Veneva A., Koblischka M.R., Simon P., Mücklich F., Murakami M. Supercond. Sci. Technol. 15:2002;796.
13. Small J.A., Michael J.R., Bright D.S. J. Microscopy. 206:2002;170.