The influence of relativistic energy losses on bandgap determination using valence EELS

Ultramicroscopy

Volumn 107, Issue 12, 2007, Pages 1178-1185

  Stoger Pollach M ^a   Schattschneider, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Bandgap; EELS; Kramers Kronig; Semiconductors

Indexed keywords

DATA RECORDING; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; GEOMETRY; RELATIVITY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

KRAMERS KRONIG RELATIONS; RELATIVISTIC EFFECTS;

ENERGY DISSIPATION;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34548287010     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.01.015     Document Type: Article

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