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Volumn 41, Issue 2, 2006, Pages 154-162

Structural and optical properties of vapour-etching based porous silicon

Author keywords

Optical properties; Silicon

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY (EELS); VAPOUR-ETCHING (VE);

EID: 32644434775     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200510548     Document Type: Article
Times cited : (6)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.