-
2
-
-
3343021434
-
-
Smela, E.; Inganäs, O.; Lundström, I. Science 1995, 268, 1735-1738.
-
(1995)
Science
, vol.268
, pp. 1735-1738
-
-
Smela, E.1
Inganäs, O.2
Lundström, I.3
-
3
-
-
0034711369
-
-
Jager, E. W. H.; Smela, E.; Inganäs, O. Science 2000, 290, 1540-1545.
-
(2000)
Science
, vol.290
, pp. 1540-1545
-
-
Jager, E.W.H.1
Smela, E.2
Inganäs, O.3
-
4
-
-
0034855078
-
-
Jérôme, C.; Geskin, V.; Lazzaroni, R.; Brédas, J. L.; Thibaut, A.; Calberg, C.; Bodart, I.; Mertens, M.; Martinot, L.; Rodrigue, D.; Riga, J.; Jérôme, R. Chem. Mater. 2001, 13, 1656-1664.
-
(2001)
Chem. Mater
, vol.13
, pp. 1656-1664
-
-
Jérôme, C.1
Geskin, V.2
Lazzaroni, R.3
Brédas, J.L.4
Thibaut, A.5
Calberg, C.6
Bodart, I.7
Mertens, M.8
Martinot, L.9
Rodrigue, D.10
Riga, J.11
Jérôme, R.12
-
5
-
-
0036030662
-
In-situ Measurement of Conducting Polymers on Evaporated and Electrochemically Deposited Au Surfaces; Smart Structures and Materials; Electroactive Polymer Actuators and Devices
-
March 17-21
-
Bohn, C. C.; Pyo, M.; Sadki, S.; Smela, E.; Reynolds, J. R.; Brennan, A. B. In-situ Measurement of Conducting Polymers on Evaporated and Electrochemically Deposited Au Surfaces; Smart Structures and Materials; Electroactive Polymer Actuators and Devices, San Diego, March 17-21, 2002; Vol. 4695, p 245.
-
(2002)
San Diego
, vol.4695
, pp. 245
-
-
Bohn, C.C.1
Pyo, M.2
Sadki, S.3
Smela, E.4
Reynolds, J.R.5
Brennan, A.B.6
-
6
-
-
0037465506
-
-
Pyo, M.; Bohn, C. C.; Smela, E.; Reynolds, J. R.; Brennan, A. B. Chem. Mater. 2003, 15, 916-922.
-
(2003)
Chem. Mater
, vol.15
, pp. 916-922
-
-
Pyo, M.1
Bohn, C.C.2
Smela, E.3
Reynolds, J.R.4
Brennan, A.B.5
-
8
-
-
0038381497
-
-
Ding, J.; Liu, L.; Spinks, G. M.; Zhou, D. Z.; Wallace, G. G.; Gillespie, J. Synth. Met. 2003, 138, 391-398.
-
(2003)
Synth. Met
, vol.138
, pp. 391-398
-
-
Ding, J.1
Liu, L.2
Spinks, G.M.3
Zhou, D.Z.4
Wallace, G.G.5
Gillespie, J.6
-
9
-
-
0001715577
-
-
Faverolle, F.; Attias, A. J.; Bloch, B.; Audebert, P.; Andrieux, C. P. Chem. Mater. 1998, 10, 740-752.
-
(1998)
Chem. Mater
, vol.10
, pp. 740-752
-
-
Faverolle, F.1
Attias, A.J.2
Bloch, B.3
Audebert, P.4
Andrieux, C.P.5
-
10
-
-
33845555539
-
-
Simon, R. A.; Ricco, A. J.; Wrighton, M. S. J. Am. Chem. Soc. 1982, 104, 2031.
-
(1982)
J. Am. Chem. Soc
, vol.104
, pp. 2031
-
-
Simon, R.A.1
Ricco, A.J.2
Wrighton, M.S.3
-
11
-
-
0345162075
-
Morphology in electrochemically grown conducting polymer films
-
U.S. Patent, 5,108,573
-
Rubinstein, I.; Gottesfeld, S.; Sabatani, E. Morphology in electrochemically grown conducting polymer films. U.S. Patent, 5,108,573, 1992.
-
(1992)
-
-
Rubinstein, I.1
Gottesfeld, S.2
Sabatani, E.3
-
15
-
-
0000948232
-
-
Guiseppi-Elie, A.; Wilson, A. M.; Tour, J. M.; Brockmann, T. W.; Zhang, P.; Aliara, D. L. Langmuir 1995, 11, 1768-1776.
-
(1995)
Langmuir
, vol.11
, pp. 1768-1776
-
-
Guiseppi-Elie, A.1
Wilson, A.M.2
Tour, J.M.3
Brockmann, T.W.4
Zhang, P.5
Aliara, D.L.6
-
16
-
-
0029968954
-
-
Lo, R.-K.; Ritchie, J. E.; Zhou, J.-P.; Zhao, J.; McDevitt, J. T.; Xu, F.; Mirkin, C. A. J. Am. Chem. Soc. 1996, 118, 11295.
-
(1996)
J. Am. Chem. Soc
, vol.118
, pp. 11295
-
-
Lo, R.-K.1
Ritchie, J.E.2
Zhou, J.-P.3
Zhao, J.4
McDevitt, J.T.5
Xu, F.6
Mirkin, C.A.7
-
17
-
-
0032072366
-
-
Smela, E.; Kariis, H.; Yang, Z.; Mecklenburg, M.; Liedberg, B. Langmuir 1998, 14, 2984-2995.
-
(1998)
Langmuir
, vol.14
, pp. 2984-2995
-
-
Smela, E.1
Kariis, H.2
Yang, Z.3
Mecklenburg, M.4
Liedberg, B.5
-
18
-
-
0032072320
-
-
Smela, E. Langmuir 1998, 14, 2996-3002.
-
(1998)
Langmuir
, vol.14
, pp. 2996-3002
-
-
Smela, E.1
-
19
-
-
0033888598
-
-
Idla, K.; Inganäs, O.; Strandberg, M. Electrochim. Acta 2000, 45, 2121-2130.
-
(2000)
Electrochim. Acta
, vol.45
, pp. 2121-2130
-
-
Idla, K.1
Inganäs, O.2
Strandberg, M.3
-
20
-
-
0030189433
-
-
Ferreira, C. A.; Aeiyach, S.; Aaron, J. J.; Lacaze, P. C. Electrochim. Acta 1996, 41, 1801.
-
(1996)
Electrochim. Acta
, vol.41
, pp. 1801
-
-
Ferreira, C.A.1
Aeiyach, S.2
Aaron, J.J.3
Lacaze, P.C.4
-
21
-
-
0003015764
-
-
Petitjean, J.; Aeiyach, S.; Lacroix, J. C.; Lacazef, P. C. J. Electroanal. Chem. 1999, 478, 92-100.
-
(1999)
J. Electroanal. Chem
, vol.478
, pp. 92-100
-
-
Petitjean, J.1
Aeiyach, S.2
Lacroix, J.C.3
Lacazef, P.C.4
-
25
-
-
34548260730
-
-
Klingenmaier, O. J.; Dobrash, S. M. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; ASTM STP 640; p 369.
-
Klingenmaier, O. J.; Dobrash, S. M. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; Vol. ASTM STP 640; p 369.
-
-
-
-
26
-
-
0037662153
-
-
Saubestre, E. B.; Durney, L. J.; Hajdu, J.; Bastenbeck, E. Plating 1965, 52, 982.
-
(1965)
Plating
, vol.52
, pp. 982
-
-
Saubestre, E.B.1
Durney, L.J.2
Hajdu, J.3
Bastenbeck, E.4
-
28
-
-
34548268955
-
-
Mattox, D. M. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; ASTM STP 640; pp 54.
-
Mattox, D. M. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; Vol. ASTM STP 640; pp 54.
-
-
-
-
29
-
-
34548282469
-
-
Hitch, T. T. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; ASTM STP 640; p 211.
-
Hitch, T. T. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; Vol. ASTM STP 640; p 211.
-
-
-
-
31
-
-
34548257185
-
-
Standard Test Methods for Measuring Adhesion by Tape Test; ASTM Committee D-1 on Paint and Related Coatings, Materials, and Applications, Subcommittee D01.23 on Physical Properties of Applied Paint Films; American Society for Testing and Materials: West Conshohocken, PA, 1994.
-
Standard Test Methods for Measuring Adhesion by Tape Test; ASTM Committee D-1 on Paint and Related Coatings, Materials, and Applications, Subcommittee D01.23 on Physical Properties of Applied Paint Films; American Society for Testing and Materials: West Conshohocken, PA, 1994.
-
-
-
-
32
-
-
0011269787
-
Standard test methods for measuring adhesion by tape test
-
ASTM. D 3359-02
-
ASTM. D 3359-02: Standard test methods for measuring adhesion by tape test 2002.
-
(2002)
-
-
-
33
-
-
0000292042
-
-
Mumbauer, P. D.; Carey, D. H.; Ferguson, G. S. Chem. Mater. 1995, 7, 1303.
-
(1995)
Chem. Mater
, vol.7
, pp. 1303
-
-
Mumbauer, P.D.1
Carey, D.H.2
Ferguson, G.S.3
-
34
-
-
34548232129
-
-
Crane, L. W.; Hamermesh, C. L. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; ASTM STP 640; p 101.
-
Crane, L. W.; Hamermesh, C. L. In Adhesion Measurement of Thin Films, Thick Films, and Bulk Coatings; Mittal, K. L., Ed.; American Society for Testing and Materials: West Conshohocken, PA, 1978; Vol. ASTM STP 640; p 101.
-
-
-
-
35
-
-
21344476277
-
-
Kondo, I.; Takenaka, O.; Kamiya, T.; Hayakawa, K.; Kinbara, A. J. Vac. Sci. Technol. A 1994, 12, 169.
-
(1994)
J. Vac. Sci. Technol. A
, vol.12
, pp. 169
-
-
Kondo, I.1
Takenaka, O.2
Kamiya, T.3
Hayakawa, K.4
Kinbara, A.5
-
36
-
-
0033342941
-
-
Smela, E.; Kallenbach, M.; Holdenried, J. J. Microelectromech. Syst. 1999, 8, 373-383.
-
(1999)
J. Microelectromech. Syst
, vol.8
, pp. 373-383
-
-
Smela, E.1
Kallenbach, M.2
Holdenried, J.3
-
37
-
-
0033355745
-
-
Smela, E. Adv. Mater. 1999, 11, 1343-1345.
-
(1999)
Adv. Mater
, vol.11
, pp. 1343-1345
-
-
Smela, E.1
-
40
-
-
0037016110
-
-
Bay, L.; Mogensen, N.; Skaarup, S.; Sommer-Larsen, P.; Jorgensen, M.; West, K. Macromol. 2002, 35, 9345-9351.
-
(2002)
Macromol
, vol.35
, pp. 9345-9351
-
-
Bay, L.1
Mogensen, N.2
Skaarup, S.3
Sommer-Larsen, P.4
Jorgensen, M.5
West, K.6
-
41
-
-
33646241511
-
-
Christophersen, M.; Shapiro, B.; Smela, E. Sens. Actuators, B 2006, 115, 596-609.
-
(2006)
Sens. Actuators, B
, vol.115
, pp. 596-609
-
-
Christophersen, M.1
Shapiro, B.2
Smela, E.3
-
43
-
-
0042381333
-
-
Liew, M. J.; Roy, S.; Scott, K. Green Chem. 2003, 5, 376-381.
-
(2003)
Green Chem
, vol.5
, pp. 376-381
-
-
Liew, M.J.1
Roy, S.2
Scott, K.3
-
50
-
-
0037451521
-
-
Smela, E. Adv. Mater. 2003, 15, 481-494.
-
(2003)
Adv. Mater
, vol.15
, pp. 481-494
-
-
Smela, E.1
-
51
-
-
0037340655
-
-
Skaarup, S.; Bay, L.; Vidanapathirana, K.; Thybo, S.; Tofte, P.; West, K. Solid State Ionics 2003, 159, 143-147.
-
(2003)
Solid State Ionics
, vol.159
, pp. 143-147
-
-
Skaarup, S.1
Bay, L.2
Vidanapathirana, K.3
Thybo, S.4
Tofte, P.5
West, K.6
-
54
-
-
9244256682
-
-
Madden, J. D. W.; Schmid, B.; Hechinger, M.; Lafontaine, S. R.; Madden, P. G. A.; Hover, F. S.; Kimball, R.; Hunter, I. W. IEEE J. Ocean Eng. 2004, 29, 738-748.
-
(2004)
IEEE J. Ocean Eng
, vol.29
, pp. 738-748
-
-
Madden, J.D.W.1
Schmid, B.2
Hechinger, M.3
Lafontaine, S.R.4
Madden, P.G.A.5
Hover, F.S.6
Kimball, R.7
Hunter, I.W.8
-
56
-
-
0043195440
-
-
Mura, G.; Vanzi, M.; Stangoni, M.; Ciappa, M.; Fichtner, W. Microelectron. Reliab. 2003, 43, 1771-1776.
-
(2003)
Microelectron. Reliab
, vol.43
, pp. 1771-1776
-
-
Mura, G.1
Vanzi, M.2
Stangoni, M.3
Ciappa, M.4
Fichtner, W.5
-
57
-
-
18444381731
-
-
Lu, W.; Fadeev, A. G.; Qi, B. H.; Smela, E.; Mattes, B. R.; Ding, J.; Spinks, G. M.; Mazurkiewicz, J.; Zhou, D. Z.; Wallace, G. G.; MacFarlane, D. R.; Forsyth, S. A.; Forsyth, M. Science 2002, 297, 983-987.
-
(2002)
Science
, vol.297
, pp. 983-987
-
-
Lu, W.1
Fadeev, A.G.2
Qi, B.H.3
Smela, E.4
Mattes, B.R.5
Ding, J.6
Spinks, G.M.7
Mazurkiewicz, J.8
Zhou, D.Z.9
Wallace, G.G.10
MacFarlane, D.R.11
Forsyth, S.A.12
Forsyth, M.13
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