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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 B, 2007, Pages 5607-5610

Electrical properties of single carbon nanoflbers grown on tips of scanning probe microscope cantilevers by ion irradiation

(4) Kitazawa, Masashi a,b Ohta, Ryo a Tanaka, Junya b Tanemura, Masaki b

a OLYMPUS CORPORATION (Japan)

b NAGOYA INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Atomic force microscope (AFM); Carbon nanofiber (CNF); Carbon nanotube (CNT); Electroconductive probes; Scanning probe microscope (SPM); Scanning spreading resistance microscopy (SSRM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CURRENT VOLTAGE CHARACTERISTICS; DIAMONDS;

CARBON NANOFIBER (CNF); ELECTROCONDUCTIVE PROBES; SCANNING SPREADING RESISTANCE MICROSCOPY (SSRM);

CANTILEVER BEAMS;

EID: 34548258273 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.46.5607 Document Type: Article

Times cited : (7)

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