Fault tolerant active pixel sensors in 0.18 and 0.35 micron technologies

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2006, Pages 448-456

  La Haye, Michelle L ^a   Jung, Cory ^a   Chen, David ^a   Chapman, Glenn H ^a   Dudas, Jozsef ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS; PIXELS; STANDARDS;

FAULT TOLERANT ACTIVE PIXEL SENSORS (FTAPS); MICRON TECHNOLOGIES;

IMAGE SENSORS;

EID: 34548206942     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.31     Document Type: Conference Paper

References (8)

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