Fault tolerant photodiode and photogate active pixel sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5677, Issue , 2005, Pages 78-89

  Jung, Cory ^a   Chapman, Glenn H ^a   La Haye, Michelle L ^a   Djaja, Sunjaya ^a   Cheung, Desmond Y H ^a   Lin, Henry ^a   Loo, Edward ^a   Audet, Yves ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Active pixel sensor; APS; CMOS image sensor; Current mode; Fault tolerant; Photodiode; Photogate; Redundancy

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ERROR ANALYSIS; GATES (TRANSISTOR); IMAGE PROCESSING; IMAGE SENSORS; REDUNDANCY; RELIABILITY;

ACTIVE PIXEL SENSOR; APS; CMOS IMAGE SENSOR; CURRENT MODE; FAULT TOLERANT; PHOTOGATE;

PHOTODIODES;

EID: 21944443578     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.588041     Document Type: Conference Paper

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