A self-correcting active pixel sensor using hardware and software correction

IEEE Design and Test of Computers

Volumn 21, Issue 6, 2004, Pages 544-551

  Chapman, Glenn H ^a   Djaja, Sunjaya ^a   Cheung, Desmond Y H ^a   Audet, Yves ^b   Koren, Israel ^c   Koren, Zahava ^c  

^a SIMON FRASER UNIVERSITY   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^c University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS; IMAGE QUALITY; IMAGE SENSORS; REDUNDANCY;

ACTIVE PIXEL SENSOR; HARDWARE REDUNDANCY; REDUNDANT-PIXEL CIRCUIT;

DIGITAL INTEGRATED CIRCUITS;

EID: 11244275663     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2004.74     Document Type: Article

References (7)

1. S.-Y. Ma and L.-G. Chen, "A Single-Chip CMOS APS Camera with Direct Frame Difference Output," IEEE J. Solid-State Circuits (JSSC 99), vol. 34, no. 10, Oct. 1999, pp. 1415-1418.
2. B. Pain et al., "A Low-Power Digital Camera-on-a-Chip Implemented in CMOS Active Pixel Approach," Proc. 12th Int'l Conf. VLSI Design (VLSI 99), IEEE Press, 1999, pp. 1-6.
3. G. Chapman and Y. Audet, "Creating 35 mm Camera Active Pixel Sensors," Proc. 1999 Int'l Symp. Defect and Fault Tolerance in VLSI Systems (DFT 99), IEEE Press, 1999, pp. 22-30.
4. Y. Audet and G.H. Chapman, "Design of a Self-Correcting Active Pixel Sensor," Proc. 2001 Int'l Symp. Defect and Fault Tolerance in VLSI Systems (DFT 01), IEEE Press, 2001, pp. 18-27.
5. I. Koren and Z. Koren, "Incorporating Fault Tolerance into a Digital Camera-on-a-Chip," Proc. 1999 Microelectronics Reliability and Qualification Workshop, Jet Propulsion Lab., 1999, pp. 1-3.
6. I. Koren, G. Chapman, and Z. Koren, "A Self-Correcting Active Pixel Camera," Proc. 2000 Int'l Symp. Defect and Fault Tolerance in VLSI Systems (DFT 2000), IEEE Press, 2000, pp. 56-64.
7. I. Koren, G. Chapman, and Z. Koren, "Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip," Proc. 2001 Int'l Symp. Defect and Fault Tolerance in VLSI Systems (DFT 01), IEEE Press, 2001, pp. 3-10.