Off-device fault tolerance For digital imaging devices

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2004, Pages 627-632

  Jin, B ^a   Feng, T ^a   Park, N J ^a   George, K M ^a   Park, N ^a   Lombardi, F ^b   Kim, Y B ^b  

^a Oklahoma State University   (United States)

^b Northeastern University   (United States)

Author keywords

CCD; Clustered defects; Digital image sensor; Repair; Soft fault tolerance; Testing

Indexed keywords

CLUSTERED DEFECTS; DIGITAL IMAGE SENSORS; ON-DEVICE FAULT TOLERANCE; SOFT FAULT TOLERANCE;

CHARGE COUPLED DEVICES; COLOR; COMPUTATIONAL METHODS; COMPUTER SCIENCE; COMPUTER SIMULATION; DIGITAL SIGNAL PROCESSING; FAULT TOLERANT COMPUTER SYSTEMS; IMAGE SENSORS; INTEGRAL EQUATIONS; OPTICAL SENSORS; PARAMETER ESTIMATION; REPAIR; TESTING;

IMAGE PROCESSING;

EID: 4644312570     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2004.1351127     Document Type: Conference Paper

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