Implementation and testing of Fault-Tolerant photodiode-based Active Pixel Sensor (APS)

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 53-60

  Djaja, Sunjaya ^a   Chapman, Glenn H ^a   Cheung, Desmond Y H ^a   Audet, Yves ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Active Pixel Sensor; CMOS image sensor; Fault Tolerance; Photodiode APS; Redundancy; SOC

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DEFECTS; DESIGN FOR TESTABILITY; HARDWARE; PHOTODIODES; PIXELS; PROGRAMMABLE LOGIC CONTROLLERS; RECONFIGURABLE HARDWARE; REDUNDANCY; SYSTEM-ON-CHIP;

ACTIVE PIXEL SENSOR; ACTIVE PIXEL SENSOR ARRAYS; CMOS IMAGE SENSOR; FAILURE MODES AND MECHANISMS; HARDWARE FAULT TOLERANCE; READOUT TRANSISTORS; SOFTWARE CORRECTION; THEORETICAL VALUES;

FAULT TOLERANCE;

EID: 84971280566     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250095     Document Type: Conference Paper

References (6)

1. Y. Audet and G. H. Chapman, "Design of a Self-Correcting Active Pixel Sensor", Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pg 18-27, San Francisco, CA. Oct. 2001.
2. G. H. Chapman and Y. Audet, "Creating 35 mm Camera Active Pixel Sensors", Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, Albuquerque, NM, pg 22-30, Nov. 1999.
3. I. Koren, G. H. Chapman, and Z. Koren, "A Self-Correcting Active Pixel Camera", Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, Yamanashi, Japan, pg 56-64 Oct. 2000.
4. I. Koren, G. H. Chapman, and Z. Koren, "Advanced Fault-Tolerance Techniques for a Color Digital Cameraon-a-Chip", Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pg 3-10, San Francisco, CA. Oct. 2001.
5. E. R. Fossum, "Active Pixel Sensors: Are CCD's Dinosaurs?", Proc. SPIE, Charge-Coupled Devices and Solid-State Optical Sensors III, Feb. 1993 Vol. 1900, pp. 2-14.
6. G. H. Chapman, "Laser Applications to IC Defect Correction", Proceedings SPIE Photonics West: Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, v 3274, pg 79-89, San Jose, 1998.