Characteristics of fault-tolerant photodiode and photogate Active Pixel Sensor (APS)

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 58-66

  La Haye, Michelle L ^a   Chapman, Glenn H ^a   Jung, Cory ^a   Cheung, Desmond Y H ^a   Djaja, Sunjaya ^a   Wang, Benjamin ^a   Liaw, Gary ^a   Audet, Yves ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE VALUES; OUTPUT SIGNALS; PIXELS; SPLIT DESIGN;

CMOS INTEGRATED CIRCUITS; ELECTRIC FAULT CURRENTS; RELIABILITY; SENSITIVITY ANALYSIS; SENSORS;

PHOTODIODES;

EID: 21944452574     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347825     Document Type: Conference Paper

References (7)

1. Y. Audet and G.H. Chapman, "Design of a Self-Correcting Active Pixel Sensor", Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 18-27, San Francisco, CA. Oct. 2001
2. O. Saint-Pé, R. Davancens, M. Tulet, P. Magnan, C. Cavadore, A Gautrand, Y. Degerli, F. Lavernhe, J. Farré, "Development and Characterisation of Active Pixel Sensors for Space Applications," Proc. of the SPIE Conference on Photonics for Space Environments VI, July 1998.
3. I. Koren, G. Chapman, and Z. Koren, "A Self-Correcting Active Pixel Camera," Proc. of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2000.
4. G. Chapman, Y. Audet, I. Koren, Z. Koren, S. Djaja, and D. Y. H. Cheung, "Self-Correcting Active Pixel Sensor using Hardware and Software Correction," to appear, IEEE Design & Test of Computers, Special Issue on Design for Yield and Reliability, June 2004.
5. S. Djaja, G. Chapman, D. Y. H. Cheung, and Y. Audet, "Implementation and Testing of Fault-Tolerant Photodiode-based Active Pixel Sensor (APS)," Proc. of the 2003 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2003.
6. D. Y. H. Cheung, G. H. Chapman, S. Djaja, Y. Audet, B. Wai, C. Jung, "Fault Tolerant Active Pixel Sensors for Large Area Digital Imaging Systems," Proc. of the Optoelectronic Integrated Circuits VIII, Photonics West, January 2004.
7. I. Koren, G. Chapman, and Z. Koren, "Replacing Light Field Calibration for Digital Imagers," to appear, Proc. of the 2004 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2004.