A new simulation method for NBTI analysis in SPICE environment

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 41-46

  Vattikonda, Rakesh ^a   Luo, Yansheng ^b   Gyure, Alex ^b   Qi, Xiaoning ^b   Lo, Sam ^b   Shahram, Mahmoud ^b   Cao, Yu ^a   Singhal, Kishore ^b   Toffolon, Dino ^b  

^a Arizona State University

^b SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; NUMERICAL METHODS; THRESHOLD VOLTAGE;

PARAMETER DEGRADATION; STRESS VOLTAGES;

RELIABILITY THEORY;

EID: 34548128261     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.21     Document Type: Conference Paper

References (13)

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