NBTI degradation and its impact for analog circuit reliability

IEEE Transactions on Electron Devices

Volumn 52, Issue 12, 2005, Pages 2609-2615

  Jha, Neeraj K ^a   Reddy, P Sahajananda ^a   Sharma, Dinesh K ^a   Rao, V Ramgopal ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

Analog mixed signal circuits; Circuit lifetime; Negative bias temperature instability (NBTI); PMOSFET degradation; Threshold voltage shift

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; COMPUTER SIMULATION; DIGITAL TO ANALOG CONVERSION; ELECTRIC CURRENTS; MOSFET DEVICES; OPERATIONAL AMPLIFIERS; RELIABILITY; THRESHOLD VOLTAGE;

CIRCUIT LIFETIME; MIXED-SIGNAL CIRCUITS; NEGATIVE BIAS TEMPERATURE INSTABILITY;

ELECTRIC NETWORK ANALYSIS;

EID: 29244437184     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.859570     Document Type: Article

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