Thickness dependence of the trap states in organic thin film of N, N′ -bis(naphthalen-1-yl)- N, N′ -bis(phenyl) benzidine

Applied Physics Letters

Volumn 91, Issue 7, 2007, Pages

  Chu, Ta Ya ^a   Song, Ok Keun ^a  

^a Samsung SDI   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; CHARGE TRANSFER; HOLE MOBILITY; INTERFACES (MATERIALS);

INDIUM TIN OXIDE; THINNER FILM;

THIN FILMS;

EID: 34548043261     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2771536     Document Type: Article

References (26)

1. S. J. Konezny, D. L. Smith, M. E. Galvin, and L. J. Rothberg, J. Appl. Phys. 99, 064509 (2006).
2. M. J. Tsai and H. F. Meng, J. Appl. Phys. 97, 114502 (2005).
3. P. E. Burrows, Z. Shen, V. Bulovic, D. M. McCarty, S. R. Forrest, J. A. Cronin, and M. E. Thompson, J. Appl. Phys. 79, 7991 (1996).
4. E. W. Forsythe, D. C. Morton, C. W. Tang, and Y. Gao, Appl. Phys. Lett. 73, 1457 (1998).
5. S. Karg, J. Steiger, and H. von Seggern, Synth. Met. 111-112, 277 (2000).
6. M. A. Lampert and P. Mark, Current Injection in Solids (Academic, New York, 1970), Chap., p. 78.
7. J. Staudigel, M. Stößel, F. Steuber, and J. Simmerer, J. Appl. Phys. 86, 3895 (1999).
8. P. Kumar, S. Chand, S. Dwivedi, and M. N. Kamalasanan, Appl. Phys. Lett. 90, 023501 (2007).
9. Z. Chiguvare and V. Dyakonov, Phys. Rev. B 70, 235207 (2004).
10. R. Q. Zhang, C. S. Lee, and S. T. Lee, J. Chem. Phys. 112, 8614 (2000).
11. B. Lu, H. J. Zhang, H. Y. Li, S. N. Bao, P. He, and T. L. Hao, Phys. Rev. B 68, 125410 (2003).
12. D. Grozea, A. Turak, Y. Yuan, S. Han, Z. H. Lu, and W. Y. Kim, J. Appl. Phys. 101, 033522 (2007).
13. Y. Jiang, Z. Yu, and W. Xue, Proc. SPIE 6030, 603007 (2006).
14. S. Y. Kim, K. Y. Kim, Y.-H. Tak, and J.-L. Lee, Appl. Phys. Lett. 89, 132108 (2006).
15. P. He, S. D. Wang, W. K. Wong, C. S. Lee, and S. T. Lee, Appl. Phys. Lett. 79, 1561 (2001).
16. Q. T. Le, F. Nüech, L. J. Rothberg, E. W. Forsythe, and Y. Gao, Appl. Phys. Lett. 75, 1357 (1999).
17. T. Y. Chu and O.-K. Song, Appl. Phys. Lett. 90, 203512 (2007).
18. A. K. Kapoor, S. C. Jain, V. Kumar, J. Poormans, and R. Mertens, J. Appl. Phys. 92, 3835 (2002).
19. I.-H. Hong, M.-W. Lee, Y.-M. Koo, H. Jeong, T.-S. Kim, and O.-K. Song, Appl. Phys. Lett. 87, 063502 (2005).
20. V. Kumar, S. C. Jain, A. K. Kapoor, J. Poortmans, and R. Mertens, J. Appl. Phys. 94, 1283 (2003).
21. M. Stößel, J. Staudigel, F. Steuber, J. Blässing, J. Simmerer, and A. Winnacker, Appl. Phys. Lett. 76, 115 (2000).
22. W. Brütting, S. Berleb, and A. Mückl, Org. Electron. 2, 1 (2001).
23. S. H. Kim, J. Jang, and J. Y. Lee, Appl. Phys. Lett. 89, 253501 (2006).
24. W.-Y. Chen, Y.-C. Ling, B.-J. Chen, H.-H. Shih, and C.-H. Cheng, Appl. Surf. Sci. 252, 6594 (2006).
25. E. W. Forsythe, M. A. Abkowitz, Y. Gao, and C. W. Tang, J. Vac. Sci. Technol. A 18, 1869 (2000).
26. J. Cui, Q. Huang, J. C. G. Veinot, He Yan, Q. Wang, G. R. Hutchison, A. G. Richter, G. Evmenenko, P. Dutta, and T. J. Marks, Langmuir 18, 9958 (2002).