Modeling the influence of charge traps on single-layer organic light-emitting diode efficiency

Journal of Applied Physics

Volumn 99, Issue 6, 2006, Pages

  Konezny, S J ^a   Smith, D L ^b   Galvin, M E ^c   Rothberg, L J ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRAPPING; DEVICE EFFICIENCY; ORGANIC MATERIALS; SINGLE-LAYER ORGANIC LIGHT-EMITTING DIODES (OLEDS);

CARRIER CONCENTRATION; CURRENT DENSITY; ELECTRONS; HOLE MOBILITY; LIGHT EMITTING DIODES; QUENCHING;

ELECTRON TRAPS;

EID: 33645657560     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2186374     Document Type: Article

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