Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics

Journal of Applied Physics

Volumn 94, Issue 2, 2003, Pages 1283-1285

  Kumar, Vikram ^a   Jain, S C ^b   Kapoor, A K ^a   Poortmans, J ^b   Mertens, R ^b  

^a SOLID STATE PHYSICS LABORATORY   (India)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC POTENTIAL; ELECTRON TRAPS; LIGHT EMITTING DIODES;

TRAP DENSITY;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 0041766630     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1582552     Document Type: Article

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