Effect of interface layer, curing temperature, and polarization on the hole transport in poly(3-hexylthiophene) thin films

Applied Physics Letters

Volumn 90, Issue 2, 2007, Pages

  Kumar, Pankaj ^a   Chand, Suresh ^a   Dwivedi, S ^a   Kamalasanan, M N ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CURING; ELECTRIC SPACE CHARGE; HOLE TRAPS; OHMIC CONTACTS; POLARIZATION; SURFACE TENSION; TEMPERATURE DISTRIBUTION; THIN FILMS;

CURING TEMPERATURE; DIODE STRUCTURES; INTERFACE BARRIERS; TRAP MODEL;

POLYMER BLENDS;

EID: 33846212666     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2431466     Document Type: Article

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