Crystal structure determination from EM images and electron diffraction patterns

Advances in Imaging and Electron Physics

Volumn 123, Issue C, 2002, Pages 257-289

  Hovmöller, Sven ^a   Zou, Xiaodong ^a   Weirich, Thomas E ^b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547964571     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(02)80066-0     Document Type: Article

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