On the phase problem in electron microscopy: The relationship between structure factors, exit waves, and HREM images

Microscopy Research and Technique

Volumn 46, Issue 3, 1999, Pages 202-219

  Zou, Xiaodong ^a  

^a STOCKHOLM UNIVERSITY   (Sweden)

Author keywords

Crystal structure factor; Crystallographic image processing; Electron wave function; Exit wave; High resolution electron microscopy; Image simulation; Structure determination

Indexed keywords

ELECTRON MICROSCOPES; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; NUMERICAL METHODS; WAVE FUNCTIONS;

CRYSTAL STRUCTURE FACTOR; CRYSTALLOGRAPHIC IMAGE PROCESSING; CRYSTALS STRUCTURES; ELECTRON MICROSCOPY IMAGES; ELECTRON WAVE FUNCTIONS; EXIT WAVES; IMAGES PROCESSING; IMAGES SIMULATIONS; STRUCTURE DETERMINATION; STRUCTURE FACTORS;

CRYSTAL STRUCTURE;

TITANIUM DERIVATIVE;

ARTICLE; ASTIGMATISM; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE RECONSTRUCTION; PRIORITY JOURNAL; STATISTICAL MODEL;

EID: 0033179422     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19990801)46:3<202::AID-JEMT4>3.0.CO;2-8     Document Type: Article

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