Corrections for Multiple Scattering in Integrated Electron Diffraction Intensities. Application to Determination of Structure Factors in the [001] Projection of AlmFe

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 54, Issue 1, 1998, Pages 102-119

  Gjønnes, Kjersti ^a   Cheng, Yifan ^b   Berg, Bjørn S ^a   Hansen, Vidar ^a  

^a UNIVERSITY OF OSLO   (Norway)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038266191     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767397009963     Document Type: Article

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