Electron diffraction versus x-ray diffraction - A comparative study of the Ta2P structure

Crystallography Reports

Volumn 43, Issue 6, 1998, Pages 956-967

  Weirich, Th E ^a   Hovmoller S ^a   Kalpen, H ^b   Ramlau, R ^b   Simon, A ^b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039835484     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (41)

1. Vainshtein, B.K., Strukturnaya Elektronographiya, Moscow: Akad. Nauk SSSR, 1956. Translated under the title Structure Analysis by Electron Diffraction Oxford: Pergamon, 1964.
2. Vainshtein, B.K., Strukturnaya Elektronographiya, Moscow: Akad. Nauk SSSR, 1956. Translated under the title Structure Analysis by Electron Diffraction Oxford: Pergamon, 1964.
3. Vainshtein, B.K., Pinsker, Z.G., Journ. Phys. Chem SSSR, 1949, vol. 23, p. 1058.
4. Zvyagin, B.B., in Electron Crystallography, Dorset, D.L., Hovmöller, S., and Zou, X.D., Eds., Dordrecht: Kluwer Academic Publishers, 1997, pp. 353-357.
5. Vainshtein, B.K., Zvyagin, B.B., Avilov, A.S., in Electron Diffraction Techniques, Cowley, J.M., Ed., Oxford: Oxford Univ. Press, 1992, vol. 1, pp. 216-312.
6. Zvyagin, B.B., Elektronografiya i Strukturnaya Kristallografiya Glinistykh Mineralov Moscow: Nauka, 1964. Translated under the title Electron Diffraction Analysis of Clay Mineral Structures New York: Plenum, 1967.
7. Zvyagin, B.B., Elektronografiya i Strukturnaya Kristallografiya Glinistykh Mineralov Moscow: Nauka, 1964. Translated under the title Electron Diffraction Analysis of Clay Mineral Structures New York: Plenum, 1967.
8. Cowley, J.M., Moodie, A.F., Acta Cryst., 1957, vol. 10, p. 609.
9. Klug, A., Chemica Scripta, 1978-79, vol. 14, p. 245.
10. Henderson, R., Unwin, P.N.T., Nature, 1975, vol. 257, p. 28.
11. Hoppe, W., Angew. Chem. (Int. Ed. Engl.), 1983, vol. 22, p. 456.
12. Dorset, D.L., Structural Electron Crystallography, New York: Plenum, 1995
13. Weirich, T.E., Ramlau, R., Simon, A., Hovmöller, S., Zou, X.D., Nature, 1996, vol. 382, p. 144.
14. Nylund, A., Acta Chem. Scand., 1966, vol. 20, p. 2393.
15. Owens, J.P., Conard, B.R., Franzen, H.F., Acta Cryst., 1967, vol. 23, p. 77.
16. Weirich, T.E., Pöttgen, R., Simon, A., Z. Krist., 1996, vol. 212, p. 928.
17. Yao, X., Franzen, H.F., J. Less-Common Metals, 1988, vol. 142, p. L27.
18. Franzen, H.F., Norrby, L.J., Acta Cryst., 1968, vol. B24, p. 601.
19. Lundström, T., Ersson, N.O., Acta Chem. Scand., 1968, vol. 22, p. 1801.
20. Rundqvist, S., Carlsson, B., Acta Chem. Scand., 1968, vol. 22, p. 2395.
21. Rundqvist, S., Carlsson, B., Pontchour, C.O., Acta Chem. Scand., 1969, vol. 23, p. 2188.
22. Harbrecht, B., Z. Krist., 1988, vol. 182, p. 118.
23. Yao, X., Franzen, H.F., J. Less-Common Metals, 1990, vol. 161, p. L37.
24. Simon, A., Angew. Chem. (Int. Ed. Engl.), 1981, vol. 20, p. 1.
25. Malmros, G., Werner, P.-E., Acta Chem. Scand., 1973, vol. 27, p. 493.
26. Johansson, K.E., Palm, T., Werner, P.-E., J. Phys. E.: Sci. Instrum., 1980, vol. 13, p. 1289.
27. Eriksson L., PUDER, Program for Unit Cell Refinement; pers. comm., Stockholm University, Sweden, 1997.
28. Zou, X.D., Sukharev, Y., Hovmöller, S., Ultramicroscopy, 1993-94, vol. 49, p. 147; vol. 52, p. 436.
29. Zou, X.D., Sukharev, Y., Hovmöller, S., Ultramicroscopy, 1993-94, vol. 49, p. 147; vol. 52, p. 436.
30. Cascarano, G. et al., SIR97, Acta Cryst., 1996, vol. A52, p. C-79.
31. Jian-sheng, J., Fang-hua, L., Acta Physica Sinica, 1984, vol. 33, p. 845.
32. Sheldrick, G.M., SHELXL93, Program for Crystal Structure Refinement, Germany: University of Göttingen, 1993.
33. O'Keefe, M.A., Proc. 13th Int. Conf. Electr. Micr., Paris, 1994, p. 475.
34. Spence, J.C.H., Zuo, J.M., Proc. 13th Int. Conf. Electr. Micr., Paris, 1994, p. 837.
35. Stoe and Cie, DIF4 Diffractometer Control Program. Release 7/DOS. Stoe and Cie, Darmstadt, Germany, 1992.
36. Stoe and Cie, X-RED. Data Reduction Program. Release 1.07/DOS. Stoe and Cie, Darmstadt, Germany, 1996.
37. Stoe and Cie, X-SHAPE. Crystal Optimisation for Numerical Absorption Correction. Release 1.01. Stoe and Cie, Darmstadt, Germany, 1996.
38. Sheldrick, G.M., SHELXTL/PC. Release 4.1. Siemens Analytical X-Ray Instruments Inc., Madison, Wisconsin, USA, 1990.
39. Larine, M., Hovmöller, S., TRIPLE - program for merging electron diffraction data, unpublished, 1997.
40. Dowty, E., ATOMS for Windows, Release 3.2, Shape Software, Kingsport, USA, 1995.
41. Cowley, J.M., in International Tables for Crystallography, Wilson, A.J.C., Ed., Kluver, Dordrecht 1995, vol. C, pp. 223-373.