Measurement of crystal thickness and crystal tilt from HRTEM images and a way to correct for their effects

Microscopy Research and Technique

Volumn 46, Issue 3, 1999, Pages 147-159

  Hovmöller, Sven ^a   Zou, Xiaodong ^a  

^a STOCKHOLM UNIVERSITY   (Sweden)

Author keywords

Amplitudes and phases; Crystallographic structure factors; Electron microscopy; Image restoration; Structure determination; Thickness determination

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRONS; FOURIER TRANSFORMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

AMPLITUDE AND PHASE; CRYSTALLOGRAPHIC STRUCTURE; CRYSTALLOGRAPHIC STRUCTURE FACTOR; ELECTRON MICROSCOPE IMAGES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; STRUCTURE DETERMINATION; STRUCTURE FACTORS; THICKNESS DETERMINATION; TILT ANGLE; TILTED CRYSTAL;

IMAGE RECONSTRUCTION;

METAL OXIDE;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ELECTRON MICROSCOPE; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE PROCESSING; IMAGE RECONSTRUCTION; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 17644433090     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19990801)46:3<147::AID-JEMT1>3.0.CO;2-1     Document Type: Article

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