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Volumn 45, Issue 10 B, 2006, Pages 8172-8176

Simulation of the electrical properties of SiH4/H2 RF discharges

Author keywords

Amorphous silicon; Fluid model; Microcrystalline silicon; PECVD

Indexed keywords

AMORPHOUS SILICON; ELECTRIC PROPERTIES; ELECTRODEPOSITION; ENERGY DISSIPATION; MICROCRYSTALLINE SILICON;

EID: 34547921677     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.8172     Document Type: Article
Times cited : (10)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.