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Volumn 46, Issue 4 B, 2007, Pages 2615-2617

Field-effect transistor with deposited graphite thin film

Author keywords

Electron cyclotron resonance (ECR) sputtering; Field effect transistor (FET); Graphite

Indexed keywords

ELECTRON CYCLOTRON RESONANCE; FILM THICKNESS; GRAPHITE; NANOCRYSTALLITES; THIN FILMS;

EID: 34547910711     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.2615     Document Type: Article
Times cited : (6)

References (11)
  • 8
    • 34547902691 scopus 로고    scopus 로고
    • Although the G- and D-band signals in the Raman spectrum are more direct indicators of the presence and integrity of a graphite lattice, we chose XPS considering its sensitivity to thin samples. Evaluations using an advanced Raman spectrometer remain to be performed
    • Although the G- and D-band signals in the Raman spectrum are more direct indicators of the presence and integrity of a graphite lattice, we chose XPS considering its sensitivity to thin samples. Evaluations using an advanced Raman spectrometer remain to be performed.
  • 9
    • 34547906680 scopus 로고    scopus 로고
    • This series resistance is the sum of those on both the source and drain sides
    • This series resistance is the sum of those on both the source and drain sides.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.