Fabrication and electric-field-dependent transport measurements of mesoscopic graphite devices

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Zhang, Yuanbo ^a   Small, Joshua P ^a   Pontius, William V ^a   Kim, Philip ^a  

^a Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTANCE; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; MICROMACHINING; OPTICAL MICROSCOPY; PLASMA ETCHING; PYROLYSIS;

GRAPHITE DEVICES; HIGHLY ORIENTED PYROLITIC GRAPHITE (HOPG); MICROMECHANICAL METHODS; VAN DER PAUW METHOD;

GRAPHITE;

EID: 17044367470     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1862334     Document Type: Article

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