Ordering and orientation of epitaxial CuInS2 films grown on GaP(001) by three-source evaporation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 2, 2007, Pages 716-720

  Vequizo, Reynaldo Magdadaro ^a   Kobayashi, Satoshi ^a   Tsuboi, Nozomu ^a   Oishi, Koichiro ^b   Kaneko, Futao ^a  

^a NIIGATA UNIVERSITY   (Japan)

^b NAGAOKA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Chalcopyrite ordering; Cu Au ordering; CulnS2; Epitaxy; Reflection high energy electron diffraction; Spinel structure; X ray diffraction

Indexed keywords

COPPER COMPOUNDS; EVAPORATION; FILM GROWTH; GALLIUM PHOSPHIDE; HIGH ENERGY ELECTRON DIFFRACTION; STOICHIOMETRY;

CHALCOPYRITE ORDERING; CU-AU ORDERING; SPINEL STRUCTURE;

EPITAXIAL FILMS;

EID: 34547907851     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.716     Document Type: Article

References (13)

1. J. Klaer, J. Bruns, R. Henninger, K. Siemer, R. Klenk, K. Ellmer, and D. Bräunig: Semicond. Sci. Technol. 13 (1998) 1456.
2. D. S. Su and S.-H. Wei: Appl. Phys. Lett. 74 (1999) 2483.
3. H. Metzner, Th. Hahn, J.-H. Bremer, M. Seibt, B. Plikat, I. Dimstorfer, and B. K. Meyer: Thin Solid Films 361-362 (2000) 504.
4. S. Kobayashi, H. Kozakai, R. M. Vequizo, N. Tsuboi, K. Oishi, and F. Kaneko: Jpn. J. Appl. Phys. 44 (2005) 999.
5. G. Wagner, U. Lange, K. Bente, J. Lenzner, and M. Lorenz: J. Cryst. Growth 209 (2000) 68.
6. G. Wagner, D. Oppermann, K. Bente, J. Lenzner, and M. Lorenz: Thin Solid Films 376 (2000) 82.
7. K. Oishi, S. Kobayashi, and F. Kaneko: J. Cryst. Growth 153 (1995) 158.
8. R. Vequizo, S. Kobayashi, N. Tsuboi, K. Oishi, and F. Kaneko: Phys. Status Solidi C 3 (2006) 2622.
9. T. Hahn, H. Metzner, B. Plikat, and M. Seibt: Thin Solid Films 387 (2001) 83.
10. S. Kobayashi, N. Tsuboi, T. Sega, K. Oishi, and F. Kaneko: Jpn. J. Appl. Phys. 42 (2003) 5485.
11. Powder Diffraction File Number 47-1372 of International Centre for Diffraction Data (ICDD).
12. J. Álvarez-García, A. P.-Rodríguez, B. Barcones, A. R.-Rodríguez, J. R. Morante, A. Janotti, S.-H. Wei, and R. Scheer: Appl. Phys. Lett. 80 (2002) 562.
13. R. Scheer and H. J. Lewerenz: J. Vac. Sci. Technol. A 12 (1994) 51.