A formal analysis of fault diagnosis with D-matrices

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 23, Issue 4, 2007, Pages 309-322

  Sheppard, J W ^a   Butcher, S G W ^a  

^a Johns Hopkins University   (United States)

Author keywords

D matrix; Fault diagnosis; Linear discriminant fault tree; Linear separability

Indexed keywords

ALGORITHMS; DISCRIMINANT ANALYSIS; ELECTRONIC EQUIPMENT TESTING; FAILURE ANALYSIS; MATHEMATICAL MODELS;

D-MATRIX; LINEAR DISCRIMINANT FAULT TREE; LINEAR SEPARABILITY;

FORMAL METHODS;

EID: 34547905803     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-006-0628-7     Document Type: Article

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