Improving the accuracy of diagnostics provided by fault dictionaries

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 180-185

  Sheppard, John W ^a   Simpson, William R ^a  

^a ARINC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; CLASSIFICATION (OF INFORMATION); COMPUTER SIMULATION; ERROR DETECTION; FAILURE ANALYSIS; VECTORS;

DIGITAL CIRCUIT DIAGNOSIS; DISTANCE BASED MATCHING ALGORITHMS; FAULT DICTIONARIES; INEXACT SIGNATURE MATCHES; INFORMATION FLOW MODEL; NEAREST NEIGHBOR CLASSIFICATION;

DIGITAL INTEGRATED CIRCUITS;

EID: 0029721963     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)