A Bayesian approach to diagnosis and prognosis using built-in test

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 3, 2005, Pages 1003-1018

  Sheppard, John W ^a   Kaufman, Mark A ^b  

^a ARINC   (United States)

^b Naval Surface Warfare Center   (United States)

Author keywords

Bayesian inference; Built in test (BIT); Diagnosis; False indication; Measurement uncertainty; Prognosis

Indexed keywords

DECISION THEORY; MEASUREMENT THEORY; PROBABILITY; RELIABILITY THEORY; SIGNAL DETECTION; STATISTICAL METHODS;

BAYESIAN INFERENCE; FALSE INDICATION; FAULT DIAGNOSIS; MEASUREMENT UNCERTAINTY; PROGNOSIS;

BUILT-IN SELF TEST;

EID: 20544450615     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.847351     Document Type: Article

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