Diagnosis knowledge representation and interference - Understanding fundamental ideas behind graphical models

IEEE Instrumentation and Measurement Magazine

Volumn 9, Issue 4, 2006, Pages 45-52

  Luo, Jianhui ^a   Tu, Haiying ^b   Pattipati, Krishna ^c   Liu, Qiao ^d   Chigusa, Shunsuke ^d  

^a University of Connecticut   (United States)

^b TONGJI UNIVERSITY   (China)

^c UNIVERSITY OF CONNECTICUT   (United States)

^d Materials Engineering Department   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPH THEORY; MATHEMATICAL MODELS; PETRI NETS; SYSTEM STABILITY; SYSTEMS ANALYSIS;

BAYESIAN NETWORKS (BNS); FAULT DIAGNOSIS; FLOW GRAPHS; GRAPHICAL MODELS;

KNOWLEDGE BASED SYSTEMS;

EID: 33747596215     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2006.1664042     Document Type: Article

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