메뉴 건너뛰기




Volumn 19, Issue 3, 2004, Pages 1154-1166

A dependency model-based approach for identifying and evaluating power quality problems

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; CONDITION MONITORING; ELECTRIC FAULT CURRENTS; FEATURE EXTRACTION; FOURIER TRANSFORMS; MATHEMATICAL MODELS; OPTIMIZATION; RELIABILITY; SENSOR DATA FUSION; SIGNAL PROCESSING; WAVELET TRANSFORMS;

EID: 3242770579     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2003.822537     Document Type: Article
Times cited : (80)

References (23)
  • 1
    • 0034171756 scopus 로고    scopus 로고
    • A scalable PQ event identification system
    • Apr
    • S. Santoso et al., "A scalable PQ event identification system," IEEE Trans. Power Delivery, vol. 15, pp. 738-743, Apr. 2000.
    • (2000) IEEE Trans. Power Delivery , vol.15 , pp. 738-743
    • Santoso, S.1
  • 3
    • 0033689505 scopus 로고    scopus 로고
    • Power quality disturbance waveform recognition using wavelet-based neural classifier - Part 1: Theoretical foundation
    • Jan
    • S. Santoso, J. Powers, W. M. Grady, and A. C. Persons, "Power quality disturbance waveform recognition using wavelet-based neural classifier - Part 1: Theoretical foundation," IEEE Trans. Power Delivery, vol. 15, pp. 222-228, Jan. 2000.
    • (2000) IEEE Trans. Power Delivery , vol.15 , pp. 222-228
    • Santoso, S.1    Powers, J.2    Grady, W.M.3    Persons, A.C.4
  • 6
    • 0005806265 scopus 로고    scopus 로고
    • On feature extraction of voltage disturbance signals
    • Chalmers Univ. Technol. Goteborg Sweden
    • E. Styvaktakis, "On feature extraction of voltage disturbance signals," Dept. Signals and Syst., Chalmers Univ. Technol., Goteborg, Sweden, 2000.
    • (2000) Dept. Signals Syst.
    • Styvaktakis, E.1
  • 10
    • 0034289948 scopus 로고    scopus 로고
    • Time-Frequency time-scale domain analysis of voltage disturbances
    • Oct
    • Y. Gu and M. H. J. Bollen, "Time-Frequency and time-scale domain analysis of voltage disturbances," IEEE Trans. Power Delivery, vol. 15, pp. 1279-1284, Oct. 2000.
    • (2000) IEEE Trans. Power Delivery , vol.15 , pp. 1279-1284
    • Gu, Y.1    Bollen, M.H.J.2
  • 11
    • 0032187879 scopus 로고    scopus 로고
    • A measurement method based on the wavelet transform for power quality analysis
    • Oct
    • L. Angrsani, P. Daponte, M. D'Apuzzo, and A. Testa, "A measurement method based on the wavelet transform for power quality analysis," IEEE Trans. Power Delivery, vol. 13, pp. 990-998, Oct. 1998.
    • (1998) IEEE Trans. Power Delivery , vol.13 , pp. 990-998
    • Angrsani, L.1    Daponte, P.2    D'Apuzzo, M.3    Testa, A.4
  • 12
    • 3242800422 scopus 로고    scopus 로고
    • IEEE. IEEE Web Site. Online Available
    • IEEE. IEEE Web Site. [Online]. Available: http://grouper.ieee.org/groups/1159.2/testwave.html/
  • 15
    • 0002590071 scopus 로고
    • Set covering algorithms using cutting planes heuristics subgradient optimization: A computational study
    • E. Balas and A. Ho, "Set covering algorithms using cutting planes, heuristics, and subgradient optimization: A computational study," Math. Programm., vol. 12, pp. 37-60, 1980.
    • (1980) Math. Programm. , vol.12 , pp. 37-60
    • Balas, E.1    Ho, A.2
  • 16
    • 0023386647 scopus 로고
    • An algorithm for set covering problems
    • J. E. Beasley, "An algorithm for set covering problems," Eur. J. Oper. Res., vol. 31, pp. 85-93, 1987.
    • (1987) Eur. J. Oper. Res. , vol.31 , pp. 85-93
    • Beasley, J.E.1
  • 17
    • 0021451318 scopus 로고
    • Using a facility location algorithm to solve large set covering problems
    • F. J. Vasko and G. R. Wilson, "Using a facility location algorithm to solve large set covering problems," Oper. Res. Lett., vol. 3, no. 2, pp. 85-90, 1984.
    • (1984) Oper. Res. Lett. , vol.3 , Issue.2 , pp. 85-90
    • Vasko, F.J.1    Wilson, G.R.2
  • 18
    • 0032136929 scopus 로고    scopus 로고
    • Optimal near-optimal algorithms for multiple fault diagnosis with unreliable tests
    • Aug
    • M. Shakeri, K. R. Pattipati, V. Raghavan, and A. Patterson-Hine, "Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests," IEEE Trans. Syst., Man, Cybern. C, vol. 28, pp. 431-440, Aug. 1998.
    • (1998) IEEE Trans. Syst. Man Cybern. C , vol.28 , pp. 431-440
    • Shakeri, M.1    Pattipati, K.R.2    Raghavan, V.3    Patterson-Hine, A.4
  • 19
    • 0025383362 scopus 로고
    • A lagrangian heuristic for set-covering problems
    • J. E. Beasley, "A lagrangian heuristic for set-covering problems," Naval Res. Logistics, vol. 37, pp. 151-164, 1990.
    • (1990) Naval Res. Logistics , vol.37 , pp. 151-164
    • Beasley, J.E.1
  • 20
    • 0025456824 scopus 로고
    • Application of heuristic search information theory to sequential fault diagnosis
    • July/Aug
    • K. R. Pattipati and M. G. Alexandridis, "Application of heuristic search and information theory to sequential fault diagnosis," IEEE Trans. Syst., Man, Cybern., vol. 20, pp. 872-887, July/Aug. 1990.
    • (1990) IEEE Trans. Syst. Man Cybern. , vol.20 , pp. 872-887
    • Pattipati, K.R.1    Alexandridis, M.G.2
  • 22
    • 0142227723 scopus 로고    scopus 로고
    • Computationally efficient algorithms for multiple fault diagnosis in large graph-based systems
    • Jan
    • F. Tu, K. R. Pattipati, S. Deb, and V. N. Malepati, "Computationally efficient algorithms for multiple fault diagnosis in large graph-based systems," IEEE Trans. Syst., Man, Cybern. A, vol. 33, pp. 73-85, Jan. 2003.
    • (2003) IEEE Trans. Syst. Man Cybern. A , vol.33 , pp. 73-85
    • Tu, F.1    Pattipati, K.R.2    Deb, S.3    Malepati, V.N.4
  • 23
    • 0032136929 scopus 로고    scopus 로고
    • Optimal near-optimal algorithms for multiple fault diagnosis with unreliable tests
    • Aug
    • M. Shakeri, K. R. Pattipati, V. Raghavan, and A. Patterson-Hine, "Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests," IEEE Trans. Syst., Man, Cybern. C, vol. 28, pp. 431-440, Aug. 1998.
    • (1998) IEEE Trans. Syst. Man Cybern. C , vol.28 , pp. 431-440
    • Shakeri, M.1    Pattipati, K.R.2    Raghavan, V.3    Patterson-Hine, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.