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Volumn 54, Issue 8, 2007, Pages 2051-2054

Effect of dead space on low-field avalanche multiplication in InP

Author keywords

Breakdown; Dead space; Heterojunction bipolar transistors; Impact ionization; Multiplication

Indexed keywords

AVALANCHE DIODES; ELECTRIC FIELDS; IMPACT IONIZATION; MATHEMATICAL MODELS; SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 34547885357     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.900010     Document Type: Article
Times cited : (9)

References (13)
  • 2
    • 0017679163 scopus 로고
    • Avalanche photodiodes
    • R. K. Willardson and A. C. Beer, Eds. New York: Academic
    • G. E. Stillman and C. M. Wolfe, "Avalanche photodiodes," in Semiconductors and Semimetals, vol. 12, R. K. Willardson and A. C. Beer, Eds. New York: Academic, 1977, pp. 291-293.
    • (1977) Semiconductors and Semimetals , vol.12 , pp. 291-293
    • Stillman, G.E.1    Wolfe, C.M.2
  • 5
    • 0001361517 scopus 로고
    • Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements
    • Apr
    • L. W. Cook, G. E. Bulman, and G. E. Stillman, "Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements," Appl. Phys. Lett., vol. 40, no. 7, pp. 589-591, Apr. 1982.
    • (1982) Appl. Phys. Lett , vol.40 , Issue.7 , pp. 589-591
    • Cook, L.W.1    Bulman, G.E.2    Stillman, G.E.3
  • 6
    • 0042859635 scopus 로고
    • Impact ionization in (100 -oriented, (110)-oriented and (111)-oriented InP avalanche photodiodes
    • Jul
    • C. A. Armiento and S. H. Groves, "Impact ionization in (100 -oriented, (110)-oriented and (111)-oriented InP avalanche photodiodes," Appl. Phys. Lett., vol. 43, no. 2, pp. 198-200, Jul. 1983.
    • (1983) Appl. Phys. Lett , vol.43 , Issue.2 , pp. 198-200
    • Armiento, C.A.1    Groves, S.H.2
  • 7
    • 0000745905 scopus 로고    scopus 로고
    • I. Umebu, A. N. M. M. Choudhury, and P. N. Robson, Ionization coefficients measured in abrupt InP junctions, Appl. Phys. Lett. 36, no. 4, pp. 302-303, Feb. 1980.
    • I. Umebu, A. N. M. M. Choudhury, and P. N. Robson, "Ionization coefficients measured in abrupt InP junctions," Appl. Phys. Lett. vol. 36, no. 4, pp. 302-303, Feb. 1980.
  • 10
    • 33846076836 scopus 로고    scopus 로고
    • Temperature dependence of impact ionization in submicron silicon devices
    • Sep
    • D. J. Massey, G. J. Rees, and J. P. R. David, "Temperature dependence of impact ionization in submicron silicon devices," IEEE Trans. Electron Devices, vol. 53, no. 9, pp. 2328-2334, Sep. 2006.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.9 , pp. 2328-2334
    • Massey, D.J.1    Rees, G.J.2    David, J.P.R.3
  • 11
    • 0026868198 scopus 로고
    • Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes
    • May
    • M. M. Hayat, W. L. Sargeant, and B. E. A. Saleh, "Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes," IEEE J. Quantum Electron., vol. 28, no. 5, pp. 1360-1365, May 1992.
    • (1992) IEEE J. Quantum Electron , vol.28 , Issue.5 , pp. 1360-1365
    • Hayat, M.M.1    Sargeant, W.L.2    Saleh, B.E.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.