Improvement in y-ray detection quality of Al/CdTe/Pt schottky-type radiation detector by sulfur treatment

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 46-50, 2006, Pages

  Yamazato, Masaaki ^a   Higa, Akira ^a   Fukuhara, Yasumasa ^a,c   Toyama, Hiroyuki ^a   Yamanoha, Satoru ^a   Owan, Ikumi ^a   Ohno, Ryoichi ^b   Toguchi, Minoru ^a  

^a UNIVERSITY OF THE RYUKYUS   (Japan)

^b Acrorad Co Ltd   (Japan)

^c Denki Kogyo Co Ltd   (Japan)

Author keywords

CdTe; Polarization; Radiation detector; Schottky contact; Sulfur treatment

Indexed keywords

BIAS VOLTAGE; GAMMA RAYS; LEAKAGE CURRENTS; POLARIZATION; SULFUR;

SCHOTTKY CONTACT; SCHOTTKY ELECTRODES; SULFUR TREATMENT;

RADIATION DETECTORS;

EID: 34547869260     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L1263     Document Type: Article

References (13)

1. Y. Eisen and A. Shor: J. Cryst. Growth 184-185 (1998) 1302.
2. M. Niraula, D. Mochizuki, T. Aoki, Y. Tomita and Y. Hatanaka: J. Cryst. Growth. 214-215 (2000) 1116.
3. C. Scheiber: Nucl. Instrum. Methods Phys. Res., Sect. A 448 (2000) 513.
4. H. Toyama, A. Nishihira, M. Yamazato, A. Higa, T. Maehama, R. Ohno and M. Toguchi: Jpn. J. Appl. Phys. 43 (2004) 6371.
5. A. Higa, A. Nishihira, H. Toyama, M. Yamazato, T. Maehama, R. Ohno and M. Toguchi: Jpn. J. Appl. Phys. 44 (2005) 6714.
6. H. Toyama, M. Yamazato, A. Higa, T. Maehama, R. Ohno and M. Toguchi: Jpn. J. Appl. Phys. 44 (2005) 6742.
7. P. S. Dutta, K. S. Sangunni, H. L. Bhar, V. Kumar and R. A. Bartynski: Appl. Phys. Lett. 65 (1994) 1695.
8. L. Geelhaar and R. A. Bartynski: J. Appl. Phys. 80 (1995) 3076.
9. C. K. Kang, Sh. U. Yuldashev, J. H. Leem, Y. S. Ryu, J. K. Hyun, H. S. Jung, H. J. Kim, T. K. Wang, H. I. Lee, Y. D. Woo and T. W. Kim: J. Appl. Phys. 88 (2000) 2013.
10. T. Takahashi, K. Hirose, C. Matsumoto, K. Takizawa, R. Ohno, T. Ozaki, K. Mori and Y. Tomita: Proc. SPIE 3446 (1998) 29.
11. M. Niraula, A. Nakamura, T. Aoki, Y. Tomita and Y. Hatanaka: Nucl. Instrum. Methods Phys. Res., Sect. A 491 (2002) 168.
12. H. L. Malm and M. Martini: IEEE Trans. Nucl. Sci. 21 (1974) 322.
13. H. Toyama, A. Higa, M. Yamazato, T. Maehama, R. Ohno and M. Toguchi: Jpn. J. Appl. Phys. 45 (2006) 8842.