Quantitative analysis of polarization phenomena in CdTe radiation detectors

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 11, 2006, Pages 8842-8847

  Toyama, Hiroyuki ^a   Higa, Akira ^a   Yamazato, Masaaki ^a   Maehama, Takehiro ^a   Ohno, Ryoichi ^b   Toguchi, Minoru ^a  

^a UNIVERSITY OF THE RYUKYUS   (Japan)

^b Acrorad Co Ltd   (Japan)

Author keywords

CdTe; Deep acceptor; Polarization phenomena; Schottky barrier; X ray and y ray detector

Indexed keywords

BIAS VOLTAGE; ELECTRIC FIELD EFFECTS; ELECTRON ENERGY LEVELS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING CADMIUM TELLURIDE;

DEEP ACCEPTORS; DETRAPPING TIME; POLARIZATION PHENOMENA; X-RAY DETECTORS;

RADIATION DETECTORS;

EID: 34547873206     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.8842     Document Type: Article

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