Correlation of grain size of pentacene-deposited surface and carbon content analyzed by X-ray photoelectron spectroscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 10 A, 2006, Pages 7871-7874

  Kim, Hong Bae ^a   Oh, Teresa ^a  

^a Chongju University   (South Korea)

Author keywords

Leakage current; Morphology; OTS; Sioc film

Indexed keywords

CARBON; CURRENT VOLTAGE CHARACTERISTICS; GRAIN SIZE AND SHAPE; LEAKAGE CURRENTS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL REACTION MECHANISM; N-OCTADECYLTRICHLOROSILANE DILUTED SOLUTION; OTS; PENTACENE; SIOC FILM;

SILICA;

EID: 34547866730     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.7871     Document Type: Article

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