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Volumn 579, Issue 2 SPEC. ISS., 2007, Pages 821-827
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Challenges and benefits of designing readout ASICs in advanced technologies
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Author keywords
Application specific integrated circuits; CMOS scaling; Deep submicron CMOS processes; Front end electronics; Low noise design; Low voltage design; Radiation effects
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
MOSFET DEVICES;
OPTIMIZATION;
RADIATION EFFECTS;
SUBSTRATES;
APPLICATION-SPECIFIC INTEGRATED CIRCUITS;
FRONTEND ELECTRONICS;
LOW NOISE DESIGNS;
LOW VOLTAGE DESIGNS;
INTEGRATED CIRCUITS;
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EID: 34547817733
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2007.05.302 Document Type: Article |
Times cited : (7)
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References (16)
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