SCOPUS 정보 검색 플랫폼

European Solid-State Device Research Conference

Volumn , Issue , 2002, Pages 95-102

Impact of parametiric mismatch and fluctuations on performance and yield of deep-submicron CMOS technologies

(1) Tuinhout, Hands P a

a NONE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC SIGNAL SYSTEMS; SIGNAL SYSTEMS; STOCHASTIC SYSTEMS;

CMOS PROCESSS; DEEP SUB-MICRON; DEEP-SUBMICRON CMOS TECHNOLOGY; DEVICE PROPERTIES; DIGITAL DESIGNS; DOPANT FLUCTUATION; MIXED SIGNAL; MIXED-SIGNAL SYSTEMS;

MIXED SIGNAL INTEGRATED CIRCUITS;

EID: 84907709834 PISSN: 19308876 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/ESSDERC.2002.194879 Document Type: Conference Paper

Times cited : (42)

References (8)

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4
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6
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