Structural, optical and electrical characterization of Hg xCd1-xTe polycrystalline films fabricated by two-source evaporation technique

Crystal Research and Technology

Volumn 42, Issue 8, 2007, Pages 817-821

  Basharat, M ^a   Hannan, M A ^a   Shah, N A ^a   Ali, A ^a   Arif, M ^a   Maqsood, A ^a  

^a QUAID I AZAM UNIVERSITY   (Pakistan)

Author keywords

Energy gap; HgCdTe; Thin film

Indexed keywords

ELECTRIC PROPERTIES; ENERGY GAP; MERCURY COMPOUNDS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; POLYMER FILMS; STRUCTURAL PROPERTIES; THERMAL EVAPORATION;

COMPOSITION RANGES; POLYCRYSTALLINE FILMS;

THIN FILMS;

EID: 34547765434     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.200710911     Document Type: Article

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