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Volumn 83, Issue 1, 2004, Pages 10-15
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Mercury-cadmium-selenide thin film layers: Structural, microscopic and spectral response studies
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Author keywords
MCS; Optical microscopy; Pseudobinary; Spectral studies; Structure
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Indexed keywords
CRYSTAL STRUCTURE;
METALLIC FILMS;
POSITIVE IONS;
SCANNING ELECTRON MICROSCOPY;
SPECTRUM ANALYSIS;
SYNTHESIS (CHEMICAL);
X RAY DIFFRACTION;
MECHANICAL CHURNING;
SPECTRAL RESPONSES;
THIN FILMS;
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EID: 0344082746
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(03)00315-8 Document Type: Article |
Times cited : (20)
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References (13)
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