A study of cadmium mercury telluride (CMT) thin film structures: Some physical observations and characteristics

Journal of Materials Science: Materials in Electronics

Volumn 16, Issue 11-12, 2005, Pages 733-739

  Mane, Samrat H ^a   Karande, V S ^a   Pujari, V B ^a   Deshmukh, L P ^a  

^a SOLAPUR UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; GLASS; LIGHT ABSORPTION; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACES; THIN FILMS;

ABSORPTION COEFFICIENT; CADMIUM MERCURY TELLURIDE (CMT) THIN FILM; DEPOSITION TIME; MECHANICAL STIRRING; OPTICAL BANDGAPS; OPTICAL TRANSITION MODE; POLYCRYSTALLINE THIN FILM STRUCTURES; ULTRASONICALLY CLEANED GLASS SUBSTRATES;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 28444460289     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-005-4976-3     Document Type: Article

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