Mesoscale scanning probe tips with subnanometer rms roughness

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Xu, Dewei ^a   Liechti, Kenneth M ^a   Ravi Chandar, K ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DROP-OFF METHOD; ELECTROLYTE INTERFACES; SUBNANOMETER RMS ROUGHNESS; SURFACE SMOOTHNESS;

APPROXIMATION THEORY; ELECTRIC POTENTIAL; INTERFACES (MATERIALS); SHEAR STRENGTH; SURFACE TENSION;

SURFACE ANALYSIS;

NANOMATERIAL;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; TRANSDUCER; ULTRASTRUCTURE;

ELECTROCHEMISTRY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, SCANNING PROBE; NANOSTRUCTURES; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTIES; TRANSDUCERS;

EID: 34547573635     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756997     Document Type: Article

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