An improved control technique for the electrochemical fabrication of scanning tunneling microscopy microtips

Review of Scientific Instruments

Volumn 68, Issue 10, 1997, Pages 3811-3816

  Liu, Anwei ^a   Hu, Xiaotang ^a   Liu, Wenhui ^a   Ji, Guijun ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTROCHEMISTRY; ETCHING; FABRICATION; FEEDBACK CONTROL; TUNGSTEN;

ELECTROCHEMICAL FABRICATION; SCANNING TUNNELING MICROSCOPY MICROTIPS;

SCANNING TUNNELING MICROSCOPY;

EID: 0031256233     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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