Correlation of edge roughness to nucleation field and nucleation field distribution in patterned Permalloy elements

Journal of Applied Physics

Volumn 102, Issue 2, 2007, Pages

  Lau, J W ^a   McMichael, R D ^a   Schofield, M A ^b   Zhu, Y ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; ELECTRONS; NICKEL ALLOYS; NUCLEATION; PROBABILITY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

FIELD DISTRIBUTION; ROUGHNESS VARIATIONS; SITU MEASUREMENTS; VORTEX NUCLEATION FIELDS;

NANOSTRUCTURED MATERIALS;

EID: 34547572068     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2761850     Document Type: Article

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