Magnetic ground state of a thin-film element

IEEE Transactions on Magnetics

Volumn 36, Issue 6, 2000, Pages 3886-3899

  Rave, Wolfgang ^a,b   Hubert, Alex ^a  

^a IEEE   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Benchmark; Numerical micromagnetics; Standard problems; Thin film elements

Indexed keywords

EXCHANGE CONSTANT; HIGH-REMANENCE STRUCTURE; LANDAU PATTERN; MAGNETIC GROUND STATE; NUMERICAL MICROMAGNETICS; STRAY FIELD ENERGY CONSTANT; SYMMETRIC NEEL WALLS; UNIAXIAL ANISOTROPY CONSTANT;

CALCULATIONS; COERCIVE FORCE; COMPUTER SIMULATION; FINITE ELEMENT METHOD; GROUND STATE; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; MAGNETIC HYSTERESIS; MAGNETISM; MATHEMATICAL MODELS; REMANENCE;

MAGNETIC THIN FILMS;

EID: 0034312744     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.914337     Document Type: Article

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