Measurement of carrier lifetime and interface recombination velocity in Si-Ge waveguides

Applied Physics Letters

Volumn 91, Issue 4, 2007, Pages

  Trita, A ^a   Cristiani, I ^a   Degiorgio, V ^a   Chrastina, D ^b   Von Kanel H ^b  

^a UNIVERSITY OF PAVIA   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; INTERFACES (MATERIALS); LASER CLADDING; OPTICAL PUMPING; SILICON ALLOYS;

INTERFACE RECOMBINATION VELOCITY; LAYER THICKNESS;

PLANAR WAVEGUIDES;

EID: 34547466122     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2760133     Document Type: Article

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