Sub-micron resolution magnetic force microscopy mapping of current paths with large probe-to-sample separation

Measurement Science and Technology

Volumn 18, Issue 8, 2007, Pages

  Pu, A ^a   Thomson, D J ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

Author keywords

Current; Imaging; Integrated circuit; Magnetic force microscopy; Mapping; MFM

Indexed keywords

IMAGING TECHNIQUES; INTEGRATED CIRCUITS; MAPPING; OPTICAL RESOLVING POWER; SEPARATION;

CURRENT PATHS; FORCE GRADIENT; PROBE GEOMETRIES;

MAGNETIC FORCE MICROSCOPY;

IMAGING TECHNIQUES; INTEGRATED CIRCUITS; MAGNETIC FORCE MICROSCOPY; MAPPING; OPTICAL RESOLVING POWER; SEPARATION;

EID: 34547439794     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/8/L01     Document Type: Article

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